Mfg Part Number: HL41930 | Manufacturer: Fairchild Semiconductor Ltd | NSN : 5962-01-122-6981 |
NIIN : 011226981 | Item Name : microcircuit memory | CAGE Code : 07263 |
FSC : 5962 Microcircuits Electronic |
Thank you for your interest in the HL41930 part of Microcircuit Memory, we have in stock on Integrated NSN. This particular Fairchild Semiconductor Ltd item is listed alongside the NSN 5962-01-122-6981 and part number HL41930 for your ease of search. With current availability for this item, we encourage you to take advantage of our Instant RFQ service in order to acquire a competitive quote for your comparisons. As our team members can be contacted 24/7x365, responses to requests or inquiries are completed with haste.
Take your time to explore our listing of part numbers like HL41930 and you will find that the NSN 5962-01-122-6981 can be found listed under FSC 5962 Microcircuits Electronic and CAGE Code 07263. However, we carry a myriad of other NSN parts, all of which have been sourced from reputable distributors like Fairchild Semiconductor Ltd. Kickoff the procurement process with a quote request that includes all of your part requirements and see how Integrated NSN can serve as your go-to sourcing solution. For additional questions, call or email us directly; we are ready to help you meet your operational deadlines however necessary.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-122-6981 Item Description: Microcircuit Memory | 5962 | 011226981 | 0 | N | D | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | D | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Hl41930 | 5 | 9 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.420 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.390 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.076 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | F16MAINTNTRNG 81755 |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND BIPOLAR AND W/ENABLE AND 3-STATE OUTPUT AND PROGRAMMED |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | PROM |
TEST | TEST DATA DOCUMENT | 88818-A574A137 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA |
TTQY | TERMINAL TYPE AND QUANTITY | 24 FLAT LEADS |
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